TY - GEN
T1 - An MOT-TDIE solver for analyzing transient fields on graphene-based devices
AU - Shi, Yifei
AU - Li, Ping
AU - Uysal, Ismail Enes
AU - Ulku, Huseyin Arda
AU - Bagci, Hakan
N1 - KAUST Repository Item: Exported on 2020-10-01
PY - 2016/11/2
Y1 - 2016/11/2
N2 - A marching on-in-time (MOT) scheme for analyzing transient electromagnetic wave interactions on devices consisting of graphene sheets and dielectric substrates is proposed. The MOT scheme discretizes time domain resistive boundary condition (TD-RBC) and Poggio-Miller-Chang-Harrington-Wu-Tsai (TD-PMCHWT) integral equation, which are enforced on the surfaces of the graphene and dielectric substrate, respectively. The expressions of the time domain resistivity and conductivity of the graphene sheet are obtained analytically from the intra-band contribution formulated in frequency domain. Numerical results, which demonstrate the applicability of the proposed scheme, are presented.
AB - A marching on-in-time (MOT) scheme for analyzing transient electromagnetic wave interactions on devices consisting of graphene sheets and dielectric substrates is proposed. The MOT scheme discretizes time domain resistive boundary condition (TD-RBC) and Poggio-Miller-Chang-Harrington-Wu-Tsai (TD-PMCHWT) integral equation, which are enforced on the surfaces of the graphene and dielectric substrate, respectively. The expressions of the time domain resistivity and conductivity of the graphene sheet are obtained analytically from the intra-band contribution formulated in frequency domain. Numerical results, which demonstrate the applicability of the proposed scheme, are presented.
UR - http://hdl.handle.net/10754/622376
UR - http://ieeexplore.ieee.org/document/7696753/
UR - http://www.scopus.com/inward/record.url?scp=84997419165&partnerID=8YFLogxK
U2 - 10.1109/APS.2016.7696753
DO - 10.1109/APS.2016.7696753
M3 - Conference contribution
SN - 9781509028863
SP - 2093
EP - 2094
BT - 2016 IEEE International Symposium on Antennas and Propagation (APSURSI)
PB - Institute of Electrical and Electronics Engineers (IEEE)
ER -