TY - GEN
T1 - An imperfect microbeam electrically actuated
T2 - ASME 2012 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE 2012
AU - Ruzziconi, Laura
AU - Bataineh, Ahmad M.
AU - Younis, Mohammad I.
AU - Lenci, Stefano
PY - 2012
Y1 - 2012
N2 - In this study we present a theoretical and experimental investigation of a microelectromechanical system (MEMS). The device is constituted of a clamped-clamped polysilicon microbeam electrostatically and electrodynamically actuated. The microbeam has imperfections in the geometry, which are related to the microfabrication process. Using a laser Doppler vibrometer, experimental testing based on forward and backward sweeps is conducted in a neighborhood of the first symmetric natural frequency. Our aim is that of introducing a simple mechanical model, which, despite the inevitable approximations, is able to catch and predict the most relevant aspects of the device response. Many parameters of the microbeam are unknown. Their values are identified by developing a parametric analysis, which is based on matching the experimental natural frequencies and the experimental frequency response diagrams. Extensive simulations are performed. Theoretical and experimental frequency responses are analyzed in detail at increasing values of electrodynamic excitation. A satisfactory concurrence of results is achieved, not only at low electrodynamic loads, but also at higher ones, when the escape (dynamic pull-in) becomes impending. This confirms that, despite the apparent simplicity, the proposed theoretical model is able to simulate the complex dynamics of the device accurately and properly. Keywords: microelectromechanical systems;parameter identification;frequency response;nonlinear dynamics.
AB - In this study we present a theoretical and experimental investigation of a microelectromechanical system (MEMS). The device is constituted of a clamped-clamped polysilicon microbeam electrostatically and electrodynamically actuated. The microbeam has imperfections in the geometry, which are related to the microfabrication process. Using a laser Doppler vibrometer, experimental testing based on forward and backward sweeps is conducted in a neighborhood of the first symmetric natural frequency. Our aim is that of introducing a simple mechanical model, which, despite the inevitable approximations, is able to catch and predict the most relevant aspects of the device response. Many parameters of the microbeam are unknown. Their values are identified by developing a parametric analysis, which is based on matching the experimental natural frequencies and the experimental frequency response diagrams. Extensive simulations are performed. Theoretical and experimental frequency responses are analyzed in detail at increasing values of electrodynamic excitation. A satisfactory concurrence of results is achieved, not only at low electrodynamic loads, but also at higher ones, when the escape (dynamic pull-in) becomes impending. This confirms that, despite the apparent simplicity, the proposed theoretical model is able to simulate the complex dynamics of the device accurately and properly. Keywords: microelectromechanical systems;parameter identification;frequency response;nonlinear dynamics.
UR - http://www.scopus.com/inward/record.url?scp=84884618809&partnerID=8YFLogxK
U2 - 10.1115/DETC2012-70505
DO - 10.1115/DETC2012-70505
M3 - Conference contribution
AN - SCOPUS:84884618809
SN - 9780791845042
T3 - Proceedings of the ASME Design Engineering Technical Conference
SP - 87
EP - 94
BT - 6th International Conference on Micro- and Nanosystems; 17th Design for Manufacturing and the Life Cycle Conference
PB - American Society of Mechanical Engineers (ASME)
Y2 - 12 August 2012 through 12 August 2012
ER -