Abstract
This paper derives the average level crossing rate (LCR) and the average outage duration (AOD) of selection combining (SC) over correlated and/or unbalanced channels. More specifically, it presents a general approach for the analysis of such systems operating over correlated Rayleigh, Rician, and/or Nakagami fading channels. The general approach is then applied to obtain generic closed-form expressions for the LCR and AOD of dual-branch SC in a correlated Rayleigh and Nakagami fading environment. The results obtained as special cases of the offered generic closed-form expressions are compared to those previously reported in the literature. Finally, some numerical examples comparing the LCR and AOD of SC with various value of fading correlation, average fading power unbalance, and Nakagami parameter are provided and discussed.
Original language | English (US) |
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Pages (from-to) | 241-245 |
Number of pages | 5 |
Journal | IEEE Vehicular Technology Conference |
Volume | 57 |
Issue number | 1 |
State | Published - 2003 |
Externally published | Yes |
Event | 57th IEEE Semiannual Vehicular Technology Conference (VTC2003) - Jeju, Korea, Republic of Duration: Apr 22 2003 → Apr 25 2003 |
ASJC Scopus subject areas
- Computer Science Applications
- Electrical and Electronic Engineering
- Applied Mathematics