Abstract
Current–voltage ( IV) characterization is the most fundamental measurement performed on solar cells. This measurement is commonly used to extract basic solar cell parameters, such as open circuit voltage, short circuit current density, fill factor, and power conversion efficiency. We were able to obtain a fast tool to find defective behavior using Simulation Program with Integrated Circuit Emphasis simulations and generate an understanding of which device property can create such defective behaviors by analyzing the second derivative of IV curves.
Original language | English (US) |
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Pages (from-to) | 015001 |
Journal | Journal of Applied Physics |
Volume | 132 |
Issue number | 1 |
DOIs | |
State | Published - Jul 5 2022 |
Bibliographical note
KAUST Repository Item: Exported on 2022-09-14Acknowledged KAUST grant number(s): OSR-2018-CARF/CCF-3079
Acknowledgements: R.M., H.H., and U.S.S. gratefully acknowledge the Deutsche Forschungsgemeinschaft (DFG) for financial support. U.S.S. is grateful to the Thüringer Ministerium für Wirtschaft, Wissenschaft und Digitale Geselschaft (TMWWDG) for funding the CEEC Jena. The project underlying these results was funded by the Free State of Thuringia under No. 2016 IZN 0009 and co-financed by funds from the European Union within the framework of the European Regional Development Fund (ERDF). S.A. and F.L. are grateful for the support from the King Abdullah University of Science and Technology (KAUST) Office of Sponsored Research (OSR) under Award No. OSR-2018-CARF/CCF-3079.
ASJC Scopus subject areas
- General Physics and Astronomy