Abstract
Metallic surface defect detection is of great significance in quality control for production. However, this task is very challenging due to the noise disturbance, large appearance variation, and the ambiguous definition of the defect individual. Traditional image processing methods are unable to detect the damaged region effectively and efficiently. In this paper, we propose a new defect detection method, Attention Cascade R-CNN with Mix-NMS (ACRM), to classify and locate defects robustly. Three submodules are developed to achieve this goal: 1) a lightweight attention block is introduced, which can improve the ability in capture global and local feature both in the spatial and channel dimension; 2) we firstly apply the cascade R-CNN to our task, which exploits multiple detectors to sequentially refine the detection result robustly; 3) we introduce a new method named Mix Non-Maximum Suppression (Mix-NMS), which can significantly improve its ability in filtering the redundant detection result in our task. Extensive experiments on a real industrial dataset show that ACRM achieves state-of-the-art results compared to the existing methods, demonstrating the effectiveness and robustness of our detection method.
Original language | English (US) |
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Title of host publication | Proceedings of ICPR 2020 - 25th International Conference on Pattern Recognition |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 423-430 |
Number of pages | 8 |
ISBN (Electronic) | 9781728188089 |
DOIs | |
State | Published - 2020 |
Event | 25th International Conference on Pattern Recognition, ICPR 2020 - Virtual, Milan, Italy Duration: Jan 10 2021 → Jan 15 2021 |
Publication series
Name | Proceedings - International Conference on Pattern Recognition |
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ISSN (Print) | 1051-4651 |
Conference
Conference | 25th International Conference on Pattern Recognition, ICPR 2020 |
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Country/Territory | Italy |
City | Virtual, Milan |
Period | 01/10/21 → 01/15/21 |
Bibliographical note
Funding Information:This work is partially supported by National Science Foundation of China (61976115, 61672280, 61732006), AI+ Project of NUAA(XZA20005, 56XZA18009), Postgraduate Research & Practice Innovation Program of Jiangsu Province (KYCX19 0195).
Publisher Copyright:
© 2021 IEEE
ASJC Scopus subject areas
- Computer Vision and Pattern Recognition