INIS
afm
25%
control
25%
data
25%
design
25%
devices
25%
electrodes
50%
electron beams
25%
electrons
100%
exploitation
25%
fabrication
50%
images
25%
ion beams
25%
molecules
25%
nanoparticles
25%
nanostructures
100%
probes
25%
resolution
25%
scanning electron microscopy
25%
shape
25%
size
25%
synchrotron radiation sources
25%
synchrotrons
25%
transistors
100%
x radiation
100%
Material Science
Biosensor
100%
Devices
33%
Electrode
66%
Electron Optical Lithography
33%
Focused Ion Beam
33%
Lithography
66%
Nanocontact
100%
Nanodevices
33%
Nanolithography
33%
Nanoparticle
33%
Probe
33%
Scanning Electron Microscopy
33%
Transistor
100%
X-Ray Lithography
100%
Engineering
Beam Lithography
33%
Design
33%
Fabrication
66%
Focused Ion Beam
33%
Images
33%
Nanometre
66%
Nanoparticles
33%
Obtains
33%
Radiation
33%
Realization
100%
Resolution Limit
33%
Single Electron
100%
Tasks
33%
Transistor
100%