In this paper, we develop an information entropy-based metric that represents the statistical quality of the generated binary sequence in Truly Random Number Generators (TRNG). The metric can be used for the design and optimization of the TRNG circuits as well as the development of efficient post-processing units for recovering the degraded statistical characteristics of the signal due to process variations. ©2008 IEEE.
|Original language||English (US)|
|Title of host publication||Midwest Symposium on Circuits and Systems|
|Number of pages||4|
|State||Published - Oct 27 2008|