A model-based technique for efficient evaluation of noise robustness

Sami Kirolos, Mosin Mondal, Kartik Mohanram, Yehia Massoud

Research output: Chapter in Book/Report/Conference proceedingConference contribution


In this paper, we present an analytical technique for deriving noise rejection curves (NRCs) and the associated noise susceptibility metric under parameter variations (Leff, VT, VDD and channel width, W). The method involves modeling of the pull-up and pull-down resistances using approximated BSIM4 device equations. Compared to circuit simulation results, the analytical model provides more than five orders of magnitude speedup while maintaining an average (maximum) error of 1.3% (5%) over the entire range of parameter variations, which makes it suitable for design optimization for noise robustness. © 2007 IEEE.
Original languageEnglish (US)
Title of host publicationMidwest Symposium on Circuits and Systems
Number of pages4
StatePublished - Dec 1 2007
Externally publishedYes

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