TY - GEN
T1 - A model-based technique for efficient evaluation of noise robustness
AU - Kirolos, Sami
AU - Mondal, Mosin
AU - Mohanram, Kartik
AU - Massoud, Yehia
N1 - Generated from Scopus record by KAUST IRTS on 2022-09-13
PY - 2007/12/1
Y1 - 2007/12/1
N2 - In this paper, we present an analytical technique for deriving noise rejection curves (NRCs) and the associated noise susceptibility metric under parameter variations (Leff, VT, VDD and channel width, W). The method involves modeling of the pull-up and pull-down resistances using approximated BSIM4 device equations. Compared to circuit simulation results, the analytical model provides more than five orders of magnitude speedup while maintaining an average (maximum) error of 1.3% (5%) over the entire range of parameter variations, which makes it suitable for design optimization for noise robustness. © 2007 IEEE.
AB - In this paper, we present an analytical technique for deriving noise rejection curves (NRCs) and the associated noise susceptibility metric under parameter variations (Leff, VT, VDD and channel width, W). The method involves modeling of the pull-up and pull-down resistances using approximated BSIM4 device equations. Compared to circuit simulation results, the analytical model provides more than five orders of magnitude speedup while maintaining an average (maximum) error of 1.3% (5%) over the entire range of parameter variations, which makes it suitable for design optimization for noise robustness. © 2007 IEEE.
UR - http://ieeexplore.ieee.org/document/4488678/
UR - http://www.scopus.com/inward/record.url?scp=51449092859&partnerID=8YFLogxK
U2 - 10.1109/MWSCAS.2007.4488678
DO - 10.1109/MWSCAS.2007.4488678
M3 - Conference contribution
SN - 1424411769
SP - 714
EP - 717
BT - Midwest Symposium on Circuits and Systems
ER -