TY - GEN
T1 - A generalized approach for the control of MEM relays
AU - Younis, M.
AU - Gao, F.
AU - De Queiroz, M. S.
PY - 2007
Y1 - 2007
N2 - In this paper, we show that voltage-controlled, electrostatic and electromagnetic micro-relays have a common dynamic structure. As a result, both types of microelectromechanical (MEM) relays are subject to the nonlinear phenomenon known as pull-in, which is usually associated with the electrostatic case. We show that open-loop control of MEM relays naturally leads to pull-in during the relay closing. Two control schemes - a Lyapunov design and a feedback linearization design - are presented with the objectives of avoiding pull-in during the micro-relay closing and improving the transient response during the micro-relay opening. Simulations illustrate the performance of the two control schemes in comparison to the typical open-loop operation of the MEM relay.
AB - In this paper, we show that voltage-controlled, electrostatic and electromagnetic micro-relays have a common dynamic structure. As a result, both types of microelectromechanical (MEM) relays are subject to the nonlinear phenomenon known as pull-in, which is usually associated with the electrostatic case. We show that open-loop control of MEM relays naturally leads to pull-in during the relay closing. Two control schemes - a Lyapunov design and a feedback linearization design - are presented with the objectives of avoiding pull-in during the micro-relay closing and improving the transient response during the micro-relay opening. Simulations illustrate the performance of the two control schemes in comparison to the typical open-loop operation of the MEM relay.
UR - http://www.scopus.com/inward/record.url?scp=46449117679&partnerID=8YFLogxK
U2 - 10.1109/ACC.2007.4282163
DO - 10.1109/ACC.2007.4282163
M3 - Conference contribution
AN - SCOPUS:46449117679
SN - 1424409888
SN - 9781424409884
T3 - Proceedings of the American Control Conference
SP - 3180
EP - 3185
BT - Proceedings of the 2007 American Control Conference, ACC
T2 - 2007 American Control Conference, ACC
Y2 - 9 July 2007 through 13 July 2007
ER -