Abstract
A fast and parallel Stroud-based stochastic collocation method for statistically characterizing electromagnetic interference and compatibility (EMI/EMC) phenomena on loaded multiscale platforms with uncertain system configurations and subject to variable electromagnetic excitations is described. The proposed method uses a previously developed hybrid time domain integral equation based field-cable-circuit to carry out deterministic EMI/EMC simulations permitting the statistical characterization of pertinent observables. The number of simulations required by the proposed method is far fewer than those needed by Monte-Carlo methods. The proposed method is used to characterize cable-induced coupling onto PC cards located in shielding enclosures. Both the hybrid simulator and the stochastic collocation code execute with near-full efficiency on distributed memory clusters.
Original language | English (US) |
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DOIs | |
State | Published - 2008 |
Event | 2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 - Detroit, MI, Germany Duration: Aug 18 2008 → Aug 22 2008 |
Conference
Conference | 2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 |
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Country/Territory | Germany |
City | Detroit, MI |
Period | 08/18/08 → 08/22/08 |
Bibliographical note
Publisher Copyright:© 2008 IEEE.
Keywords
- electromagnetic coupling
- electromagnetic interference and compatibility
- fast solvers
- hybrid solvers
- parallelization
- stochastic collocation
- Stroud integration rules
- time domain integral equations
ASJC Scopus subject areas
- Condensed Matter Physics
- Electrical and Electronic Engineering