A comparative study of high resolution transmission electron microscopy, atomic force microscopy and infrared spectroscopy for GaN thin films grown on sapphire by metalorganic chemical vapor deposition

Zhe Chuan Feng*, Kun Li, Yun Tian Hou, Jie Zhao, W. Lu, W. E. Collins

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

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Chemistry

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