Abstract
Recent power reduction techniques aggressively modulate the supply voltage of embedded buffering memories allowing acceptable hardware errors to flow through the processing chain. In this paper, we present a model that captures the statistics of both channel noise and hardware failures. We further introduce a modified Viterbi decoder that maximizes the likelihood of the received data based on the distribution of the combined noise. Simulation results show a consistent improvement in BER performance across all SNRs with an area overhead ranging from 0.65% to 3.26% compared to the conventional Viterbi decoder when synthesized using a 65 nm standard library. © 2010 IEEE.
Original language | English (US) |
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Title of host publication | Conference Record - Asilomar Conference on Signals, Systems and Computers |
DOIs | |
State | Published - Dec 1 2010 |
Externally published | Yes |