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(110) and (100) Sidewall-oriented FinFETs: A performance and reliability investigation
C. D. Young*, K. Akarvardar, M. O. Baykan, K. Matthews, I. Ok, T. Ngai, K. W. Ang, J. Pater, Casey Smith, M. M. Hussain, P. Majhi, C. Hobbs
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
27
Scopus
citations