Engineering
Nanowires
61%
Heterostructures
59%
Field-Effect Transistor
44%
Nitride
38%
Heterojunctions
35%
Photodetection
33%
Plane Strain
33%
Photodetector
31%
Complementary Metal-Oxide-Semiconductor
25%
Optoelectronic Device
24%
Nanoscale
23%
Strain Effect
22%
Interlayer
20%
Light-Emitting Diode
19%
Strain
19%
Monocrystalline
17%
Metal Gate
17%
Surface Defect
16%
Optical Channel
16%
Reverse Bias
14%
Thin Films
14%
Gate Stack
14%
Ultraviolet Light
13%
Power Density
12%
Spectral Responsivity
12%
Band Offset
11%
Communication Link
11%
Crystalline Silicon
11%
Heat Generation
11%
Battery (Electrochemical Energy Engineering)
11%
Microstructure
11%
Soft Material
11%
Maximum Temperature
11%
Dislocation Behavior
11%
Electro-Optics
11%
Electric Power Utilization
11%
Free Space
11%
Communication Channel
11%
Temperature Gradient
11%
Responsivity
11%
High Temperature Operations
11%
Heat Sink
11%
Portable Device
11%
Passivation
11%
Bistables
11%
Surface Passivation
11%
Current Injection
11%
Integrated Optoelectronics
11%
Band Gap
11%
Material Science
Heterojunction
100%
Nanowires
72%
Oxide Compound
55%
Nitride Compound
53%
Sapphire
51%
Photosensor
38%
Crystalline Material
33%
Density
33%
Aluminum Nitride
27%
Epitaxy
27%
Field Effect Transistors
25%
Pulsed Laser Deposition
24%
Photoluminescence
20%
Complementary Metal-Oxide-Semiconductor Device
18%
Film
18%
Al2O3
16%
Surface Defect
16%
Thin Films
16%
Nucleation
16%
Gallium
13%
Molecular Beam Epitaxy
12%
Laser Diode
11%
Metal-Semiconductor Junction
11%
Refractive Index
11%
Surface Passivation
11%
Linewidth
11%
Structural Property
11%
Single Crystal
11%
Film Growth
11%
Two-Dimensional Material
11%
Electronic Circuit
11%
Dielectric Material
10%
Keyphrases
Deep Ultraviolet
33%
Photodetector
22%
Heterojunction
22%
Reverse Bias
16%
Responsivity
16%
Ga2O3
14%
Pulsed Laser Deposition
13%
3D Architecture
11%
Ultra-high Density
11%
Soft Materials
11%
Vinyl
11%
Out-of-plane Strain
11%
Unconventional Substrates
11%
Double Heterostructure
11%
Surface Defect Passivation
11%
Heat Management
11%
Enhanced Cooling
11%
Electrical Characterization
11%
Air Channel
11%
Multiple Stacks
11%
Incident Light
11%
Hyperuniform
11%
Integrated Optoelectronics
11%
Preflow
11%
Solar-blind
11%
Light Wavelength
11%
Optical Channel Characterization
11%
MgO Substrate
11%
Force Loading
11%
Oxide Nitride
11%
Ultraviolet Photodetection
11%
Single Domain
11%
Optical Characteristics
11%
Ultra-low Power
11%
Interfacial Characteristics
11%
Aluminum Oxide
11%
CMOS Integrated
11%