Engineering
Thin Films
66%
Heterojunctions
66%
Electric Field
66%
Power Electronics
66%
Limitations
66%
Band Gap
66%
Metal-Oxide-Semiconductor Field-Effect Transistor
66%
Power Electronic Device
33%
High Power Electronics
33%
Performance Requirement
33%
Computer Aided Design
33%
Schottky Barrier Diode
33%
Growth Method
33%
Semiconductor Type
33%
Fabrication Technique
33%
Nitride
33%
Ray Diffraction
26%
Current Drain
22%
Metrics
22%
Power Integrated Circuits
22%
Measurement Resolution
13%
Precursor Solution
13%
Photocurrent
13%
Photodetector
13%
Low-Temperature
13%
Transmissions
13%
High Resolution
13%
Power Device
13%
Material Science
Oxide Compound
100%
Gallium
100%
Solution (Chemistry)
66%
Indium
66%
Sapphire
66%
Thin Films
66%
Electron Mobility
66%
Metal-Oxide-Semiconductor Field-Effect Transistor
66%
Schottky Diode
66%
Heterojunction
44%
Silicon
33%
Silicon Carbide
33%
Gallium Nitride
33%
Diffraction Measurement
26%
Electronic Circuit
22%
Transistor
22%
Power Device
13%
UV-Visible Spectroscopy
13%
Photosensor
13%
High-Resolution Transmission Electron Microscopy
13%
Keyphrases
Output Conductance
22%
Recessed Channel
22%
Source-gated Transistors
22%
Intrinsic Gain
22%
Drain Saturation Voltage
22%
Guard Ring
19%
Inga
16%
Indium Doping
16%
Growth Method
11%
Silicon-based Semiconductors
11%