Equipments Details
Description
Titan Cs Probe is equipped with HR - TEM, HR - STEM, EDX analysis and high energy resolution EELS with monochromator. It is capabile of performing BF/DF imaging; Cs probe corrected high resolution STEM imaging of samples with high contrast; high resolution TEM imaging of samples with high contrast EFTEM imaging; fast EELS STEM spectrum imaging; DPC of magnetic samples; monochromated STEM/TEM at high/low accelerating voltages; TEM/STEM tomography of samples; and electron diffraction. Point resolution: 0.08 nm, information limit: 0.1 nm, EFTEM resolution: 1 nm, STEM-resolution: 0.08 nm, electron tomography resolution: 1 nm. Lorentz TEM and Fast EELS STEM spectrum imaging. Magnetic samples can be analyzed (DPC and holography) with this microscope.
Model: Titan
Model: Titan
Details
| Name | Transmission electron microscope - Titan Cs Probe |
|---|---|
| Acquisition date | 04/1/10 |
| Manufacturers | FEI Company |
×
![]()
Fingerprint
Explore the research areas in which this equipment has been used. These labels are generated based on the related outputs. Together they form a unique fingerprint.