Equipments Details
Description
Scanning Electron Microscope / Focused Ion Beam for SEM imaging, fast composition analysis, micro milling, Pt deposition of small sample.
Model: Quanta 3D FEG
Model: Quanta 3D FEG
Details
Name | FEI Quanta3D FEG SEM/FIB |
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Acquisition date | 04/1/10 |
Manufacturers | FEI Company |
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