Univ Hebei Technology Applies for Patent on DIC (Digital Image Correlation) Measuring Technology-Based Thermal Expansion Measuring Device for Material

  • Jun Chen

Press/Media: Press / Media

PeriodJan 12 2020

Media coverage

1

Media coverage

  • TitleUniv Hebei Technology Applies for Patent on DIC (Digital Image Correlation) Measuring Technology-Based Thermal Expansion Measuring Device for Material
    Media name/outletGlobal IP News. Optics & Imaging Patent News
    Country/TerritoryIndia
    Date01/12/20
    PersonsJun Chen
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